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We are seeking a hands-on Coherent RF Architect to lead silicon bring-up, validation, and production test development for a mixed-signal Analog Front-End (AFE) featuring high-speed DACs, ADCs, PLL/clocking , and the RF electrical interface to the Transmitter and Receiver Optical SubAssembly (TROSA) used in the optical coherent pluggable. The role owns end-to-end AFE characterization, from bench measurement and automation through correlation to simulation test coverage. NION2026
Key Responsibilities Silicon Bring-up & Debug
Own first-silicon bring-up for DAC/ADC/PLL blocks: power-up sequencing, register access, clock tree bring-up, and initial functional validation.
Debug mixed-signal issues across domains (clocking, analog biasing, digital control, interfaces, and test modes).
DAC: SFDR, IMD, THD, SNR, ENOB, spurs vs. output amplitude, output frequency, sampling frequency, temperature, supply, and code format; static linearity where applicable.
ADC: SNR, ENOB, SFDR, interleaving mismatch (offset/gain/timing), harmonic/spurious behavior, clock sensitivity.
PLL/Clocking: phase noise, integrated jitter, spur analysis, jitter transfer/tolerance where relevant to the system.
AFE-level metrics: frequency response, passband ripple, impedance/termination impact, crosstalk, noise coupling, and sensitivity to board/connector effects.
Characterize RF electrical behavior of the Transmitter and Receiver Optical SubAssembly, including bandwidth, frequency response, impedance matching, insertion and return loss, Gain, noise figure (where applicable), and linearity.
Use robust data practices: versioned test scripts, metadata capture, calibration traceability, and reproducible analysis notebooks.
Work with design teams to define: test hooks, observability, calibration registers, and design-for-test requirements for analog blocks.
Collaborate closely with Analog/RF design, SiGe IC teams, DSP, Signal Integrity (SI), photonics, module, and manufacturing teams.
Strong fundamentals in high speed electronics and practical experience with test equipment such as high bandwidth oscilloscopes, phase noise analyzer, spectrum analyzer, VNA.
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